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The Scanning Probe Microscope (SPM) is an international surface analysis instrument developed in recent years, which is a high-tech product that integrates optical, mechanical, and electrical technology by using optoelectronics, laser technology, weak signal detection technology, applied optics technology, computer high-speed acquisition and control, and high-resolution graphics processing technology and other modern technological achievements. CD BioSciences offers Zeiss Sigma VP Field Emission Scanning Electron Microscope-based scanning probe microscopy imaging services.
Technical specifications
1. Field-emission electron source and advanced optics enable high resolution field-free imaging at low accelerating voltage with in-lens secondary electron (SE) detector
2. SE detector is used in field-free mode for comprehensive low to high magnification imaging of a variety of samples
3. Back scattered electron detector with a Bruker SDD EDS detector supports visualisation of compositional differences across the specimen surface
4. Bruker SDD EDS detector enables analysis of elements down to Boron (atomic number 5)
5. Variable-pressure (low vacuum) mode supports imaging of non-conductive and vacuum-sensitive specimens
Supports medical, biological and material sciences.
Provides a broad range of surface imaging capabilities and elemental analysis for both conductive and non-conducting samples.
The areas of application of SPM are vast. Whether it is a basic discipline such as physics, chemistry, biology, or medicine, or an applied discipline such as materials or microelectronics, there is a place for it. If you are interested in the services of CD BioSciences, please feel free to contact us.
Please fill out the form below and we will get back to you as soon as possible with a quotation for the item you are interested in.
CD BioSciences is committed to providing a tailored service to researchers working in the fields of biology and chemistry. Our mission is to accelerate the progress of your research through our technical support.