Scanning Probe Microscope Imaging Service—FEI Verios 460L XHR-SEM

The Scanning Probe Microscope (SPM) is an international surface analysis instrument developed in recent years, which is a high-tech product that integrates optical, mechanical, and electrical technology by using optoelectronics, laser technology, weak signal detection technology, applied optics technology, computer high-speed acquisition and control, and high-resolution graphics processing technology and other modern technological achievements. CD BioSciences offers FEI Verios 460L XHR-SEM-based scanning probe microscopy imaging services.

Name of the Instrument/Platform

FEI Verios 460L XHR-SEM

MANUFACTURER:

FEI

Introduction

• Detectors
1. Elstar in-lens SE detector (TLD-SE)
2. Elstar in-lens BSE detector (TLD-BSE)
3. Elstar in-column SE detector (ICD)
4. Elstar in-column BSE detector (MD)
5. Everhart-Thornley SE detector (ETD)
6. IR camera for viewing sample/column
7. Chamber mounted Nav-Cam+
8. Retractable low voltage, high contrast solid-state backscatter electron detector (DBS)
9. Integrated beam current measurement
• Additional Attachments
1. Oxford XMax30 EDS Detector
2. Automatic Loadlock
• Additional Software
1. MAPS 2.0 (large area mapping) software

Summary

The FEI Verios is an ultra-high-resolution scanning electron microscope capable of resolving nanometre size features. Equipped with a number of in-lens and in-column detectors it is optimally suited to operating at low accelerating voltages which is beneficial for observing surface-based information or features from materials with a low atomic number.

The areas of application of SPM are vast. Whether it is a basic discipline such as physics, chemistry, biology, or medicine, or an applied discipline such as materials or microelectronics, there is a place for it. If you are interested in the services of CD BioSciences, please feel free to contact us.

For research use only, not intended for any clinical use.

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