Scanning Electron Microscope Imaging Service—FEI Helios Nanolab^™ G3 DualBeam^™ Focused Ion Beam-Scanning Electron Microscope

Scanning Electron Microscopy (SEM) provides high-resolution and high-depth-of-field images of the surface and near the surface of a sample. SEM is one of the most widely used analytical tools as it can quickly provide very detailed images. SEM provides elemental identification of almost the entire periodic table and is also adept at generating detailed images of surface topography. CD BioSciences offers FEI Helios Nanolab^™ G3 DualBeam^™ Focused Ion Beam-Scanning Electron Microscope-based scanning electron microscopy Imaging services available to assist customers in biological and materials research.

Name of the Instrument/Platform

FEI Helios Nanolab^™ G3 DualBeam^™ Focused Ion Beam-Scanning Electron Microscope

MANUFACTURER:

FEI

Feature Highlights

1. Ideal for the analysis of surface topographies or post-fixed resin-embedded samples by secondary or backscatter electron detection using the ETD, retractable CBS, and in-column TLD, MD, or ICD detectors.
2. The focused gallium-ion beam ablates fine slices as thin as 4-nm to reveal structure under the resin block surface in order to provide a novel 3D picture of the sample volume.
3. Maps^™ software package allows large-format montaging over hundreds of micrometers, providing a "Google Street View"-like dataset.
4. Imaging data from any outside source may be imported and correlated in the Maps software for Correlative Light and Electron Microscopy (CLEM)
5. A retractable STEM detector allows low-voltage (10-30 keV) screening of TEM specimens.

Applications

1. Isotropic 3D data acquisition
2. High Efficiency detectors for SE and BSE imaging
3. Precision 5-axes motorized stage
4. Better than 1.0 nm SEM resolution at all keVs
5. Better than 4.0 nm FIB resolution at 30 keV
6. Low kV FIB imaging down to 500 V

Summary

The FEI Helios Nanolab G3 DualBeam FIB-SEM platform is designed to access a new world of extreme high resolution 2D and 3D characterization. Precise FIB slicing, combined with a high precision piezo stage and superb SEM performance support automated software for high-resolution sample surface montaging, unattended sample preparation, or 3D characterization. Serial slicing and imaging using the AutoSlice and View^™ software creates a 3D-image stack with 4-nm isotropic resolution that may be reconstructed in separate software for high resolution visualization. Traditional SEM imaging allows high-resolution detail of sample surfaces of all types and materials to be quickly and easily elucidated.

The Scanning Electron Microscopy Laboratory at CD BioSciences offers a wide range of high-end microscopy equipment. More importantly, our expertise and experience are invaluable to the industries and customers we serve. Please do not hesitate to contact us for cooperation or questions.

For research use only, not intended for any clinical use.

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