Scanning Electron Microscopy (SEM) provides high-resolution and high-depth-of-field images of the surface and near the surface of a sample. SEM is one of the most widely used analytical tools as it can quickly provide very detailed images. SEM provides elemental identification of almost the entire periodic table and is also adept at generating detailed images of surface topography. CD BioSciences offers Zeiss ULTRA Plus-based scanning electron microscopy Imaging services available to assist customers in biological and materials research.
1. Schottky field-emission source for high resolution and beam current
2. Exceptional low kV performance
3. Topographic imaging to < 1 nm using an in-lens secondary electron detector
4. High-resolution orientation and strain imaging by AsB detector
5. Nanoscale, high-sensitivity compositional imaging using EsB detector and limiting grid
6. Charge compensator (gas injector) for imaging of non-conducting specimens
7. Oxford Instruments AZtec integrated EDS and EBSD system, with X-Max 20 mm2 silicon drift EDS detector and Symmetry CMOS EBSD detector, allowing 0.3 ms per point acquisition
8. Dedicated sample holders for transmission Kikuchi diffraction (TKD) analysis
9. Oxford Instruments Layerprobe software for measuring thin film thicknesses and composition
10. High-current mode for extended depth of field and EBSD
11. STEM detector with brightfield and darkfield imaging
12. Evactron on-chamber Plasma cleaner for removing carbon contamination.
The Scanning Electron Microscopy Laboratory at CD BioSciences offers a wide range of high-end microscopy equipment. More importantly, our expertise and experience are invaluable to the industries and customers we serve. Please do not hesitate to contact us for cooperation or questions.
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CD BioSciences is committed to providing a tailored service to researchers working in the fields of biology and chemistry. Our mission is to accelerate the progress of your research through our technical support.