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Scanning Electron Microscope Imaging Service—JEOL JSM-840A SEM

Scanning Electron Microscopy (SEM) provides high-resolution and high-depth-of-field images of the surface and near the surface of a sample. SEM is one of the most widely used analytical tools as it can quickly provide very detailed images. SEM provides elemental identification of almost the entire periodic table and is also adept at generating detailed images of surface topography. CD BioSciences offers JEOL JSM-840A SEM-based scanning electron microscopy Imaging services available to assist customers in biological and materials research.

Name of the Instrument/Platform

JEOL JSM-840A SEM

MANUFACTURER:
JEOL

Summary

1. Electron Sources: Tungsten Hairpin
2. Imaging Modes: Secondary Electron, Backscattered Electron Accelerating
3. Voltages: 1.0-30 kV, 100ev Steps
4. Working Distances: 8 mm, 20 mm, and 45 mm
5. Magnifications: 15×-50,000×
6. Image Recording:
7. Orion Digital Capture Interface: Fast and Slow Scan
8. Polaroid 4" × 5" sheet camera
9. NTSC Composite video output
10. EDAX Genesis 2000 Energy Dispersive x-ray microanalysis system

The Scanning Electron Microscopy Laboratory at CD BioSciences offers a wide range of high-end microscopy equipment. More importantly, our expertise and experience are invaluable to the industries and customers we serve. Please do not hesitate to contact us for cooperation or questions.

For research use only, not intended for any clinical use.
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CD BioSciences is committed to providing a tailored service to researchers working in the fields of biology and chemistry. Our mission is to accelerate the progress of your research through our technical support.

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