Scanning Electron Microscope Imaging Service—Hitachi S-4800

Scanning Electron Microscopy (SEM) provides high-resolution and high-depth-of-field images of the surface and near the surface of a sample. SEM is one of the most widely used analytical tools as it can quickly provide very detailed images. SEM provides elemental identification of almost the entire periodic table and is also adept at generating detailed images of surface topography. CD BioSciences offers Hitachi S-4800-based scanning electron microscopy Imaging services available to assist customers in biological and materials research.

Name of the Instrument/Platform

Hitachi S-4800

Introduction

Instrument Specifications
1. This state-of-the-art field emission SEM includes advanced detection technology with a high resolution. A guaranteed resolution of 2.0 nm at 1kV for low voltage applications.
2. An objective lens design with "Super ExB Filter" technology. The Super ExB Filter collects and separates the various components of pure SE, compositional SE and BSE electron signals.
3. A specimen stage for large sample applications with 110 mm × 110 mm stage movement and computer controlled 5 axes motorization with graphical interface software.
4. 1.4 nm Resolution at 1 kV with Beam Deceleration Technology
5. 1.0 nm Resolution at 15 kV
6. New Super ExB Filter Technology
7. 200 mm Specimen Diameter
8. 5 Axis Motorized Eucentric Stage
9. Advanced Dry Vacuum System

The Scanning Electron Microscopy Laboratory at CD BioSciences offers a wide range of high-end microscopy equipment. More importantly, our expertise and experience are invaluable to the industries and customers we serve. Please do not hesitate to contact us for cooperation or questions.

For research use only, not intended for any clinical use.

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