Microscope Imaging Service—FEI Helios SEM/FIB

Confocal microscopy is an optical imaging technique that uses point-by-point illumination and spatial pinhole modulation to remove scattered light from the non-focal plane of the sample, allowing for improved optical resolution and visual contrast compared to traditional imaging methods. CD BioSciences, the imaging experts, can provide you with FEI Helios SEM/FIB-based confocal microscopy imaging services.

Name of the Instrument/Platform

FEI Helios SEM/FIB

MANUFACTURER:

FEI

Technical Capabilities

1. Focused ion beam (FIB), 0.5-30 kV for fast cutting and efficient polishing
2. Electron beam tuneable from 20 V- 30 kV
3. Sub-nm resolution SEM from 0.5 kV to 30 kV
4. Plasma cleaner in chamber
5. Gas Injection System (GIS) for deposition of W, C, Pt
6. FEI EasyLift NanoManipulator
7. SE and 2 BSE detectors
8. In-situ, automated creation of TEM lamella
9. AutoSlice and View 3D reconstructions
10. Precise marching complex micro- and nanoscale devices
11. Circuit editing at nanoscale

Summary

The FEI Helios NanoLab 660 DualBeam system integrates advanced scanning electron microscope (SEM) and focused ion beam (FIB) technologies with plasma cleaner, Gas Injection System (GIS) and the FEI EasyLift NanoManipulator. TheFEI Helios NanoLab 660 DualBeam system makes milling, imaging, analysis, and sample preparation easy and efficient.

CD BioSciences' FEI Helios SEM/FIB-based confocal microscopy service is an ideal partner for cutting-edge biomedical research, providing precise 3D imaging, as well as accurate imaging of cell structure and dynamic processes, all in one package. If you are interested, please feel free to contact us.

For research use only, not intended for any clinical use.

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