Electron Microscope Imaging Service—FEI Scios DualBeam FIB SEM

Electron microscopes can excite electrons to form images that magnify micron and nanostructures up to 10 million times, providing amazing levels of fine magnification and allowing researchers to observe even individual atoms. CD BioSciences can provide innovative solutions for electron microscopy and microanalysis. We offer FEI Scios DualBeam FIB SEM instruments that allow customers to combine high-resolution imaging with physical, elemental, chemical and electrical analysis to obtain usable data from the widest range of samples.

Name of the Instrument/Platform

FEI Scios DualBeam FIB SEM

MANUFACTURER:

FEI

Introduction

NICol UHR non-immersion FESEM column
1. High resolution field emission-SEM column, with:
1) High stability Schottky field emission gun
2) Beam current range: 1 pA to 400 nA
3) Landing energy range: 20 eV - 30 keV*
4) Accelerating voltage range: 200 eV - 30 keV
Electron beam resolution at optimum working distance
1. High vacuum imaging, optimum WD
2. 0.8 nm at 30 keV STEM
3. 1.6 nm at 1 keV
Sidewinder ion volumn
1. High-current gallium liquid metal ion source
2. Acceleration voltage: 500 V - 30 kV
3. Magnification: 40× - 1.28M× based on Polaroid output
4. Drift suppression mode as standard for non-conductive samples
Ion beam resolution
1. High vacuum imaging, optimum WD
2. 3.0 nm (statistics over 50 edges)
3. 5.0 nm (statistics over 1000's of edges)
Detectors
1. Trinity detection system (in-lens and in-column)
2. Everhardt-Thornley SED
3. ICE detector (secondary electrons and ions) *
4. DBS retractable segmented under lens BSED*
5. STEM retractable segmented detector (BF, DF, HADF, HAAD

Applications

1. Nanopatterning
2. Slice N View allows:
3. 3D imaging
4. 3D spectroscopy (EDS) for hyperspectral imaging
5. 3D diffraction (EBSD)
6. TEM sample preparation for thin lamella liftouts

Summary

A FIB SEM combines focused ion beam (FIB) and scanning electron microscopy (SEM) techniques to allow site-specific analysis and precise ablation of materials on the micro scale. FEI Scios^™ is an ultra-high-resolution analytical DualBeam^™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

CD BioSciences provides FEI Scios DualBeam FIB SEM-based electron microscopy imaging services to our clients. If you are interested, please feel free to contact us.

For research use only, not intended for any clinical use.

Related Services