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Scanning Probe Microscope Imaging Service—JPK Nanowizard AFM

The Scanning Probe Microscope (SPM) is an international surface analysis instrument developed in recent years, which is a high-tech product that integrates optical, mechanical, and electrical technology by using optoelectronics, laser technology, weak signal detection technology, applied optics technology, computer high-speed acquisition and control, and high-resolution graphics processing technology and other modern technological achievements. CD BioSciences offers JPK Nanowizard AFM-based scanning probe microscopy imaging services.

Name of the Instrument/Platform

JPK Nanowizard AFM

MANUFACTURER:
Bruker
MODEL:
Nanowizard

Summary

The AFM measures the mechanical properties of surfaces, with up to 100 × 100 µm lateral range and a maximum peak-to-valley height variation of 15 µm. Matching cantilever stiffness and/or probe geometry with the sample properties is essential for obtaining accurate data.

The areas of application of SPM are vast. Whether it is a basic discipline such as physics, chemistry, biology, or medicine, or an applied discipline such as materials or microelectronics, there is a place for it. If you are interested in the services of CD BioSciences, please feel free to contact us.

For research use only, not intended for any clinical use.
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CD BioSciences is committed to providing a tailored service to researchers working in the fields of biology and chemistry. Our mission is to accelerate the progress of your research through our technical support.

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