Scanning Probe Microscope Imaging Service—Asylum AFM

The Scanning Probe Microscope (SPM) is an international surface analysis instrument developed in recent years, which is a high-tech product that integrates optical, mechanical, and electrical technology by using optoelectronics, laser technology, weak signal detection technology, applied optics technology, computer high-speed acquisition and control, and high-resolution graphics processing technology and other modern technological achievements. CD BioSciences offers Asylum AFM-based scanning probe microscopy imaging services.

Name of the Instrument/Platform

Asylum AFM

Introduction

1. Modes available
Contact, AC (tapping) and Dual AC, 1-D forces, lateral force, nanolithography, Electrostatic Force, Kelvin probe, conductive AFM, Magnetic Force, piezoelectric force, thermal AFM
2. Scan range
90 μm × 90 μm × 15 μm closed loop
3. Z noise
< 0.06 nm 0.1Hz-1kHz BW
4. Cantilever noise
< 0.02 nm Adev, 0.1Hz-1kHz BW.
5. Analog to Digital Converters
One 16-bit, 5 MHz channel
6. Digital to Analog Converters
Five 16-bit 100kHz channel
7. Direct Digital Synthesizer
Six 24-bit 100kHz channels, plus two 10-bit 10MHz summed on a single DAC

Applications

Stiffness and adhesion measurements, frictional force imaging. Nanolithography, electrostatic force microscopy, and scanning surface potential. Conductive AFM, magnetic and piezoresponse force microscopy.

The areas of application of SPM are vast. Whether it is a basic discipline such as physics, chemistry, biology, or medicine, or an applied discipline such as materials or microelectronics, there is a place for it. If you are interested in the services of CD BioSciences, please feel free to contact us.

For research use only, not intended for any clinical use.

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