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Scanning Electron Microscope Imaging Service—JEOL JSM-7600F SEM

Scanning Electron Microscopy (SEM) provides high-resolution and high-depth-of-field images of the surface and near the surface of a sample. SEM is one of the most widely used analytical tools as it can quickly provide very detailed images. SEM provides elemental identification of almost the entire periodic table and is also adept at generating detailed images of surface topography. CD BioSciences offers JEOL JSM-7600F SEM-based scanning electron microscopy Imaging services available to assist customers in biological and materials research.

Name of the Instrument/Platform

JEOL JSM-7600F SEM

MANUFACTURER:
JEOL

Introduction

1. Accelerating voltage of 0. 1 (Gentle beam mode) to 30 KV
2. Magnification range from 25 to 1,000,000
3. Large specimen chamber (up to 200 mm diameter)
4. Located inside a cleanroom environment, allowing a variety of processes to be developed

Summary

Purpose: Structural characterization and e-beam lithography of complex patterns at nanometer scale precision

The Scanning Electron Microscopy Laboratory at CD BioSciences offers a wide range of high-end microscopy equipment. More importantly, our expertise and experience are invaluable to the industries and customers we serve. Please do not hesitate to contact us for cooperation or questions.

For research use only, not intended for any clinical use.
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CD BioSciences is committed to providing a tailored service to researchers working in the fields of biology and chemistry. Our mission is to accelerate the progress of your research through our technical support.

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