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Scanning Electron Microscopy (SEM) provides high-resolution and high-depth-of-field images of the surface and near the surface of a sample. SEM is one of the most widely used analytical tools as it can quickly provide very detailed images. SEM provides elemental identification of almost the entire periodic table and is also adept at generating detailed images of surface topography. CD BioSciences offers FEI DualBeam™ Focused Ion Beam Scanning Electron Microscope-based scanning electron microscopy Imaging services available to assist customers in biological and materials research.
In a single instrument platform it combines a high resolution scanning electron microscope (SEM) with high resolution focussed ion beam (FIB).
The FIB uses a focused beam of Ga+ ions to sputter the surface of the sample to expose sub-surface features. The ion beam can also be used to form high resolution images if the beam current is kept low enough to avoid excessive surface sputtering.
The addition of a high resolution SEM allows the collection of electron induced signals from the exposed surfaces. These include secondary and back-scattered electron images, characteristic x-ray and electron back-scattered diffraction images for analysis of crystal structure, crystallographic orientation and phase type. The instrument also has a solid state STEM detector allowing the imaging of very thin samples.
1. Sample machining
2. Sample cross-sections
3. 3D microscopy
4. Slice and view
5. TEM foil preparation
6. Atom probe needles
7. Feature size measurement
8. Site specific sample selection
9. Sample selection, placement and shaping
10. Micro-analytical investigating
11. EDXS - Energy Dispersive X-ray Spectroscopy
12. The collection of the emitted x-rays by a solid state detector and the measurement and display of their energy distribution. This makes possible the identification, quantification and mapping of elements in a solid sample.
13. EBSD- Electron Back - Scattered Diffraction
14. OIM - Orientation Imaging Microscopy
15. The measurements of local orientation by the collection of patterns formed by diffraction of back - scattered electrons within the crystal structure
16. 'Delpi' - a program which allows the simultaneous collection of EBSD and EDXS data. This makes it Possible to use sample chemistry to aid in phase identification when materials have similar diffraction patterns.
The Scanning Electron Microscopy Laboratory at CD BioSciences offers a wide range of high-end microscopy equipment. More importantly, our expertise and experience are invaluable to the industries and customers we serve. Please do not hesitate to contact us for cooperation or questions.
Please fill out the form below and we will get back to you as soon as possible with a quotation for the item you are interested in.
CD BioSciences is committed to providing a tailored service to researchers working in the fields of biology and chemistry. Our mission is to accelerate the progress of your research through our technical support.