Microscope Imaging Service—SEM XL30: 30 kV Scanning Electron Microscope (SEM)

Confocal microscopy is an optical imaging technique that uses point-by-point illumination and spatial pinhole modulation to remove scattered light from the non-focal plane of the sample, allowing for improved optical resolution and visual contrast compared to traditional imaging methods. CD BioSciences, the imaging experts, can provide you with SEM XL30: 30 kV Scanning Electron Microscope (SEM)-based confocal microscopy imaging services.

Name of the Instrument/Platform

SEM XL30: 30 kV Scanning Electron Microscope (SEM)

Feature Highlights

1. Secondary electron detector SE as standard detector
2. Backscattered Electron detector (BSE) is very sensitive to the distribution of heavy elements
3. Energy Dispersive X-ray spectroscopy (EDX) for elemental analysis
4. Environmental (ESEM) mode to permit the direct imaging of uncoated non-conducting samples such as plastics or wet biological samples
5. High sample throughput
6. Standard Definition imaging mode (1.3 Mega Pixels) and Extra High Definition mode (11.6 Mega Pixels) available
7. Realistically achievable resolution: approximately 10 nm (dependant on sample)

Summary

30 kV Scanning Electron Microscope (SEM) able to also operate in ESEM (environmental) mode.
The XL30 is able to work with wide range of samples from Mechanical, Electrical, and Chemical Engineering departments, as well as from the departments Geology and Chemistry. Please note, magnetic samples cannot be used.

CD BioSciences' SEM XL30: 30 kV Scanning Electron Microscope (SEM)-based confocal microscopy service is an ideal partner for cutting-edge biomedical research, providing precise 3D imaging, as well as accurate imaging of cell structure and dynamic processes, all in one package. If you are interested, please feel free to contact us.

For research use only, not intended for any clinical use.

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