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Electron Microscope Imaging Service—JEOL JSM-7600F Field-Emission SEM

Electron microscopes can excite electrons to form images that magnify micron and nanostructures up to 10 million times, providing amazing levels of fine magnification and allowing researchers to observe even individual atoms. CD BioSciences can provide innovative solutions for electron microscopy and microanalysis. We offer JEOL JSM-7600F Field-Emission SEM instruments that allow customers to combine high-resolution imaging with physical, elemental, chemical and electrical analysis to obtain usable data from the widest range of samples.

Name of the Instrument/Platform

JEOL JSM-7600F Field-Emission SEM

MANUFACTURER:
JEOL

Summary

The 7600F is a field-emission scanning electron microscope that magnifies up to one million times for visualization and imaging of nanoscale-sized objects. It provides optimal tools for studying the widest possible variety of sample materials:
1. high stable probe current
2. upper and lower secondary-electron detectors
3. retractable in-lens backscatter detector
4. low-angle backscatter detector
5. scanning transmission electron (STEM) detector
6. energy-dispersive X-ray spectrometry

CD BioSciences provides JEOL JSM-7600F Field-Emission SEM-based electron microscopy imaging services to our clients. If you are interested, please feel free to contact us.

For research use only, not intended for any clinical use.
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CD BioSciences is committed to providing a tailored service to researchers working in the fields of biology and chemistry. Our mission is to accelerate the progress of your research through our technical support.

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