Electron Microscope Imaging Service—Hitachi S-4300 E/N (FESEM)

Electron microscopes can excite electrons to form images that magnify micron and nanostructures up to 10 million times, providing amazing levels of fine magnification and allowing researchers to observe even individual atoms. CD BioSciences can provide innovative solutions for electron microscopy and microanalysis. We offer Hitachi S-4300 E/N (FESEM) instruments that allow customers to combine high-resolution imaging with physical, elemental, chemical and electrical analysis to obtain usable data from the widest range of samples.

Name of the Instrument/Platform

Hitachi S-4300 E/N (FESEM)

Introduction

This instrument utilizes a thermal Schottky field emission cathode, a hybrid electron beam source that offers high brightness and excellent resolution over a wide range of accelerating voltages. This type of emitter combines the benefits of a true cold-cathode field emission source (low beam energies that are not well suited for analytical techniques, but achieves a small, extremely stable beam diameter leading to improved resolution and high brightness) with traditional thermionic emission (heating the electron emission source to produce a wider, but more energetic electron beam, but with decreased ultimate resolution).
In addition, this instrument was also chosen because of its ability to accommodate relatively large samples (specimens up to 160 mm diameter examined) on a five axis, motorized eucentric stage. The instrument is Web-based, and can be operated in real time from a computer with the appropriate software. This makes it invaluable for collaborative projects. The S-4300SE/N

Technical Capabilities

Detailed Description of Instrument Capability.
The S-4300 E/N field emission variable pressure scanning electron microscope (FEVPSEM) is a new generation instrument that combines the high resolution and image quality of a field emission source with the versatility of variable pressure (VP) operation, allowing it to handle difficult or 'dirty' samples at much higher chamber pressures.
1. This microscope has a pressure operating range of 10 - 1000 Pa, which means it can be used to examine a broader range of wet, oily or non-conducting samples than most other VPSEMs.
2. The FE electron source is kept at ultra-high vacuum by differential pumping through apertures built into the column when in the VP mode. The high resolution, coupled with the VP chamber allows for minimal sample preparation and no conductive metal coating that may obscure the ultimate obtainable resolution.
3. Hydrated, fresh samples can also be imaged in conjunction with a cooling stage that keeps delicate samples from desiccating under the vacuum.
4. The VP mode is also important for routinely imaging samples from the material sciences such as non-conductors, photo-resist, carbon nano-tubes, wet fiber analysis, polymer chemistry, filters, combustion synthesis materials, etc.
5. High resolution can be achieved in both high pressure and high vacuum modes, using a variety of detectors such as secondary electron, backscattered electron and an environmental secondary electron detector (ESED).
6. All operations within and between the various use modes are controlled and safety-interlocked by the instrument, so the SEM is self-protected against most user error, a necessity in a multi-user facility.

Important Notes

The long-term beam stability of the Schottky emitter makes it ideally suited to elemental analysis. The absence of the thin, conductive metal coat generally applied to traditional SEM samples, allows for greater resolution of fine structure as well more accurate elemental analysis, particularly for light elements.
Because of the hydrated nature of living organisms, traditional sample preparation for living specimens includes killing and fixing the organism, a chemical dehydration, followed by critical point drying (CPD) and coating with a thin conductive metal layer prior to placing it in the vacuum of the SEM. This is a necessary, albeit time-consuming process, that can either subtly or drastically change the true, fine structure of a sample. Within recent years, physical fixation protocols for the SEM (i.e. ultra-rapid freezing) have been developed to replace the chemical procedures for some samples. A cryo-stage system attached to an SEM, allows the direct imaging of rapidly

Summary

The Hitachi S-4300 E/N (FESEM), with guaranteed 1.5 nm resolution at 15 kV (5.0 nm at 1.0 kV), combines both high resolution and variable pressure into a single instrument, providing the greatest flexibility for investigators across a broad spectrum of departments at TTU.

CD BioSciences provides Hitachi S-4300 E/N (FESEM)-based electron microscopy imaging services to our clients. If you are interested, please feel free to contact us.

For research use only, not intended for any clinical use.

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