Electron Microscope Imaging Service—Hitachi S-3000N

Electron microscopes can excite electrons to form images that magnify micron and nanostructures up to 10 million times, providing amazing levels of fine magnification and allowing researchers to observe even individual atoms. CD BioSciences can provide innovative solutions for electron microscopy and microanalysis. We offer Hitachi S-3000N instruments that allow customers to combine high-resolution imaging with physical, elemental, chemical and electrical analysis to obtain usable data from the widest range of samples.

Name of the Instrument/Platform

Hitachi S-3000N

Introduction

There is a standard secondary electron detector, for use in high vacuum only, and backscattered and absorbed electron detectors, which can be used in both high vacuum and variable pressure modes. The microscope has an Oxford Inca EDX system with a light element Si(Li) X-ray detector (15 mm WD).
Technical Specifications
• Accelerating Voltage 0.3-30kV
• Secondary electron image Resolution: 3.5 nm (25kV, HV mode).
• Backscattered electron image Resolution: 5.0 nm (25kV, VP mode).
• Magnification range: 15× ~ 300,000×.
• Variable pressure range: 1-270Pa. >/li>
• Maximum Specimen size: 150 mm diameter × 20 mm high
• Specimen Tilt/ Rotation: 0-60 degrees, 360 degree rotation
• Specimen movement: 100 mm (×), 50 mm. (Y), 5~40 mm (Z)
• Detectors: Secondary, Backscattered, Absorbed Current
• XEDS position: 15 mm working distance, 35degree take off.

Summary

The Hitachi S-3000N is a Variable Pressure SEM with a tungsten electron source. It is capable of imaging specimens at high vacuum and also in a variable pressure range from 1-270 Pa. This allows nonconducting specimens to be imaged without coating with a conductive film.

CD BioSciences provides Hitachi S-3000N-based electron microscopy imaging services to our clients. If you are interested, please feel free to contact us.

For research use only, not intended for any clinical use.

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